Omnibus tests of fit for exponentiality based on a characterization via the mean residual life function

We study two new omnibus goodness of fit tests for exponentiality, each based on a characterization of the exponential distribution via the mean residual life function. The limiting null distributions of the tests statistics are the same as the limiting null distributions of the Kolmogorov-Smirnov and Cramér-von Mises statistics proposed when testing the simple hypothesis that the distribution of the sample variables is uniform on the interval [0, 1].