KIT | KIT-Bibliothek | Impressum | Datenschutz
Open Access Logo
§
Volltext
URN: urn:nbn:de:swb:90-AAA298620012

Lorentz angle measurements in irradiated silicon detectors between 77 K and 300 K

De Boer, Willem; Bartsch, Valeria; Bol, Johannes; Dierlamm, Alexander; Grigoriev, Eugene; Hauler, Florian; Heising, Stephan; Herz, O.; Jungermann, Levin; Keraenen, R.; Koppenhoefer, M.; Roederer, F.; Schneider, T.

Abstract:
Future experiments are using silicon detectors in a high
radiation environment and in high magnetic fields. The radiation
tolerance of silicon improves by cooling it to temperatures
below 180 K. At low temperatures the mobility increases, which
leads to larger de of the charge carriers by the Lorentz force.
A good knowledge of the Lorentz angle is needed for design and
operation of silicon detectors. We present measurements of the
Lorentz angle between 77 K and 300 K before and after
irradiation with a primary beam of 21 MeV protons.


Zugehörige Institution(en) am KIT Institut für Experimentelle Kernphysik (IEKP)
Publikationstyp Buch
Jahr 2001
Sprache Englisch
Identifikator KITopen ID: 29862001
Verlag Karlsruhe
KIT – Die Forschungsuniversität in der Helmholtz-Gemeinschaft KITopen Landing Page