A Driving Robot for Autonomous Vehicles on Extreme Courses Stiller, C. 2001. Telematics applications in automation and robotics - a Proceedings volume from the IFAC conference, 24 - 26 July 2001. Ed.: K. Schilling, 267–274, Pergamon
Technical Handling and Control of the transformation of Anhydrite to Gypsum Schwotzer, M.; Scheiber, J.; Schweike, U.; Weidler, P.; Nüesch, R. 2001. EUG XI. 11th Annual Conference of the European Union of Geosciences, 8th-12th April 2001, Strasbourg, France. Contribution of Industrial Geoscience to Fundamental Understanding and Vice Versa: Building Material
Thermal analysis in Clay Science Emmerich, K. 2001. Tone in der industriellen Anwendung. Beiträge zur Jahrestagung der Deutschen Ton- und Tonmineralogiegruppe in Limburg an der Lahn, 2001. Hrsg.: K. Czurda
Umweltzeichen für ökologische Bauprodukte Kohler, N.; Eiermann, O.; Bunke, D.; Quack, D.; Jeske, U.; Möller, R.; Breiter, H. P.; Linden, W.; Hinkes, R. 2001. Berlin : Umweltbundesamt, 2001 (Texte / Umweltbundesamt ; 2001,34) UBA-FB 000176
Personenverkehr Zumkeller, D. 2001. 50 Jahre Straßenwesen in Deutschland. Hrsg.: M. Ronellenfitsch, 117–131, Bundesministerium für Verkehr 6 Bau- und Wohnungswesen
Crystallization kinetics of basalt glass Burkhard, D. J. M. 2001. Recrystallization and Grain Growth; Proceedings of the first joint international conference, August 27 - 31, 2001, RWTH Aachen, Germany. Hrsg.: G. Gottstein, 1391–1402, Springer Verlag
Experiments on Cross-language Acoustic Modeling Schultz, T.; Waibel, A. 2001. Proceedings of the 7th European Conference on Speech Communication and Technology, Eurospeech 2001, Aalborg, Denmark, 30. September 2001, 2721
Automated analysis and comparison of striated toolmarks Heizmann, M.; Puente Leon, F. 2001. Proceedings / Fourth European Meeting for Shoe Print, Tool Mark Examiners, SPTM 2001, May 15 - 18, 2001. Ed.: H. Katterwe, 121–132, BKA
Model-based analysis of striation patterns in forensic science Heizmann, M.; Puente Leon, F. 2001. Enabling technologies for enforcement and security, 5 - 8 November 2000. Ed.: S.K. Bramble, 533–544, Society of Photo-optical Instrumentation Engineers (SPIE)