PT Journal AU Quan, T Li, P Long, F Zeng, S Luo, Q Hedde, PN Nienhaus, GU Huang, Z TI Ultra-fast, high-precision Image Analysis for Localization-based Superresolution Microscopy SO Optics express PY 2010 BP 11867 EP 11876 VL 18 IS 11 DI 10.1364/OE.18.011867 LA english ER