PT Journal
AU Quan, T
   Li, P
   Long, F
   Zeng, S
   Luo, Q
   Hedde, PN
   Nienhaus, GU
   Huang, Z
TI Ultra-fast, high-precision Image Analysis for Localization-based Superresolution Microscopy
SO Optics express
PY 2010
BP 11867
EP 11876
VL 18
IS 11
DI 10.1364/OE.18.011867
LA english
ER