PT Journal AU Falter, J Langewisch, G Hölscher, H Fuchs, H Schirmeisen, A TI Field ion microscopy characterized tips in noncontact atomic force microscopy: Quantification of long-range force interactions SO Physical Review B - Condensed Matter and Materials Physics PY 2013 BP 115412/1 EP 9 VL 87 IS 11 DI 10.1103/PhysRevB.87.115412 LA english ER