PT Journal
AU Falter, J
   Langewisch, G
   Hölscher, H
   Fuchs, H
   Schirmeisen, A
TI Field ion microscopy characterized tips in noncontact atomic force microscopy: Quantification of long-range force interactions
SO Physical Review B - Condensed Matter and Materials Physics
PY 2013
BP 115412/1
EP 9
VL 87
IS 11
DI 10.1103/PhysRevB.87.115412
LA english
ER