PT Unknown AU Maier, T Schmehl, K Leibfried, T TI Dielectric Frequency Measurement of Semiconductive Layers in Xlpe Cables SE 2018 IEEE CEIDP: IEEE Conference on Electrical Insulation and Dielectric Phenomena. Proceedings. PY 2018 BP 70 EP 73 DI 10.1109/CEIDP.2018.8544800 LA english PI Cancún, Mexiko ER