PT Unknown
AU Maier, T
   Schmehl, K
   Leibfried, T
TI Dielectric Frequency Measurement of Semiconductive Layers in Xlpe Cables
SE 2018 IEEE CEIDP: IEEE Conference on Electrical Insulation and Dielectric Phenomena. Proceedings.
PY 2018
BP 70
EP 73
DI 10.1109/CEIDP.2018.8544800
LA english
PI Cancún, Mexiko
ER