PT Journal AU Wandkowsky, N Drexlin, G Fränkle, FM Glück, F Groh, S Mertens, S TI Validation of a model for radon-induced background processes in electrostatic spectrometers SO Journal of Physics G: Nuclear and Particle Physics PY 2013 BP 085102/1 EP 18 VL 40 DI 10.1088/0954-3899/40/8/085102 LA english ER