PT Journal
AU Wandkowsky, N
   Drexlin, G
   Fränkle, FM
   Glück, F
   Groh, S
   Mertens, S
TI Validation of a model for radon-induced background processes in electrostatic spectrometers
SO Journal of Physics G: Nuclear and Particle Physics
PY 2013
BP 085102/1
EP 18
VL 40
DI 10.1088/0954-3899/40/8/085102
LA english
ER