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Analysis of nanostructures based on diffraction of X-ray radiation

Köhl, Martin

Two topics are considered: (i) the analysis of time-resolved in situ X-ray diffraction studies of free-standing self-catalyzed GaAs nanowires grown on Si-111 (with a focus on the wurtzite zinc blende polytypism) and (ii) detailed investigations of reconstruction algorithms for coherent X-ray diffractive imaging of inhomogeneously strained nanostructures. Significant improvements of the applicability of the technique by proper modifications of the HIO+ER algorithm are demonstrated.

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DOI: 10.5445/IR/1000045158
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Photonenforschung und Synchrotronstrahlung (IPS)
Publikationstyp Hochschulschrift
Publikationsjahr 2014
Sprache Englisch
Identifikator urn:nbn:de:swb:90-451583
KITopen-ID: 1000045158
Verlag KIT, Karlsruhe
Art der Arbeit Dissertation
Fakultät Fakultät für Physik (PHYSIK)
Institut Institut für Photonenforschung und Synchrotronstrahlung (IPS)
Prüfungsdaten 05.12.2014
Referent/Betreuer Prof. T. Baumbach
Schlagwörter diffraction, X-rays, nanowires, in-situ, CXDI
KIT – Die Forschungsuniversität in der Helmholtz-Gemeinschaft
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