Analysis of nanostructures based on diffraction of X-ray radiation

Two topics are considered: (i) the analysis of time-resolved in situ X-ray diffraction studies of free-standing self-catalyzed GaAs nanowires grown on Si-111 (with a focus on the wurtzite zinc blende polytypism) and (ii) detailed investigations of reconstruction algorithms for coherent X-ray diffractive imaging of inhomogeneously strained nanostructures. Significant improvements of the applicability of the technique by proper modifications of the HIO+ER algorithm are demonstrated.