KIT | KIT-Bibliothek | Impressum
Open Access Logo
DOI: 10.5445/IR/1000051435

Degradation in FPGAs: Monitoring, Modeling and Mitigation

Amouri, Abdulazim

This dissertation targets the transistor aging degradation as well as the associated thermal challenges in FPGAs (since there is an exponential relation between aging and chip temperature). The main objectives are to perform experimentation, analysis and device-level model abstraction for modeling the degradation in FPGAs, then to monitor the FPGA to keep track of aging rates and ultimately to propose an aging-aware FPGA design flow to mitigate the aging.

Zugehörige Institution(en) am KIT Institut für Technische Informatik (ITEC)
Publikationstyp Hochschulschrift
Jahr 2015
Sprache Englisch
Identifikator URN: urn:nbn:de:swb:90-514357
KITopen ID: 1000051435
Verlag Karlsruhe
Abschlussart Dissertation
Fakultät Fakultät für Informatik (INFORMATIK)
Institut Institut für Technische Informatik (ITEC)
Prüfungsdaten 23.04.2015
Referent/Betreuer Prof. M. B. Tahoori
KIT – Die Forschungsuniversität in der Helmholtz-Gemeinschaft KITopen Landing Page