Finite Element study on semi-elliptical surface cracks in a cylinder
Abstract:
Different types of test specimens were applied in the past for the measure-ment of subcritical crack growth in silica. The rather large scatter of crack-growth curves calls for re-analysis of stress intensity factors. In the present note semi-elliptical surface cracks in long cylinders are addressed. In addition the first regular stress term (T-stress) is considered.
| Zugehörige Institution(en) am KIT | Institut für Angewandte Materialien - Keramik im Maschinenbau (IAM-KM) |
| Publikationstyp | Forschungsbericht/Preprint |
| Publikationsjahr | 2016 |
| Sprache | Englisch |
| Identifikator | ISSN: 2194-1629 urn:nbn:de:swb:90-523641 KITopen-ID: 1000052364 |
| Verlag | Karlsruher Institut für Technologie (KIT) |
| Umfang | VI, 7 S. |
| Serie | KIT Scientific Working Papers ; 41 |
| Schlagwörter | Semi-elliptical crack, silica, stress intensity, T-stress |