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DOI: 10.5445/IR/1000052364

Finite Element study on semi-elliptical surface cracks in a cylinder

Rizzi, Gabriele; Fett, Theo

Different types of test specimens were applied in the past for the measure-ment of subcritical crack growth in silica. The rather large scatter of crack-growth curves calls for re-analysis of stress intensity factors. In the present note semi-elliptical surface cracks in long cylinders are addressed. In addition the first regular stress term (T-stress) is considered.

Zugehörige Institution(en) am KIT Institut für Angewandte Materialien - Keramik im Maschinenbau (IAM-KM)
Publikationstyp Forschungsbericht
Jahr 2016
Sprache Englisch
Identifikator ISSN: 2194-1629
URN: urn:nbn:de:swb:90-523641
KITopen ID: 1000052364
Verlag KIT, Karlsruhe
Umfang VI, 7 S.
Serie KIT Scientific Working Papers ; 41
Schlagworte Semi-elliptical crack, silica, stress intensity, T-stress
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