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Contrast transfer functions for Zernike phase contrast in full-field transmission hard X-ray microscopy

Yang. Yang; Cheng, Yin; Heine, Ruth; Baumbach, Tilo

Abstract (englisch): Full-field transmission hard X-ray microscopy (TXM) has been widely applied to study morphology and structures with high spatial precision and to dynamic processes. Zernike phase contrast (ZPC) in hard X-ray TXM is often utilized to get an in-line phase contrast enhancement for weak-absorbing materials with little contrast differences. Here, following forward image formation, we derive and simplify the contrast transfer functions (CTFs) of the Zernike phase imaging system in TXM based on a linear space-shift-invariant imaging mode under certain approximations. The CTFs in ZPC in their simplified forms show a high similarity to the one in free-space propagation X-ray imaging systems.

Zugehörige Institution(en) am KIT Laboratorium für Applikationen der Synchrotronstrahlung (LAS)
Institut für Photonenforschung und Synchrotronstrahlung (IPS)
Publikationstyp Zeitschriftenaufsatz
Jahr 2016
Sprache Englisch
Identifikator DOI: 10.1364/OE.24.006063
ISSN: 1094-4087
KITopen ID: 1000053974
HGF-Programm 56.03.30; LK 01
Erschienen in Optics express
Band 24
Heft 6
Seiten 6063-6070
Bemerkung zur Veröffentlichung Gefördert durch den KIT-Publikationsfonds
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