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The 16th International Conference on X-ray Absorption Fine Structure (XAFS16)

Grunwaldt, J.-D.; Hagelstein, M.; Rothe, J.

Abstract (englisch):
This preface of the proceedings volume of the 16th International Conference on X- ray Absorption Fine Structure (XAFS16) gives a glance on the five days of cutting-edge X-ray science which were held in Karlsruhe, Germany, August 23 - 28, 2015. In addition, several satellite meetings took place in Hamburg, Berlin and Stuttgart, a Sino-German workshop, three data analysis tutorials as well as special symposia on industrial catalysis and XFELs were held at the conference venue.


Zugehörige Institution(en) am KIT Institut für Beschleunigerphysik und Technologie (IBPT)
Institut für Katalyseforschung und -Technologie (IKFT)
Institut für Nukleare Entsorgung (INE)
Institut für Technische Chemie und Polymerchemie (ITCP)
Publikationstyp Zeitschriftenaufsatz
Jahr 2016
Sprache Englisch
Identifikator DOI: 10.1088/1742-6596/712/1/011001
ISSN: 1742-6588
URN: urn:nbn:de:swb:90-579041
KITopen ID: 1000057904
HGF-Programm 56.98.01; LK 01
Erschienen in Journal of physics / Conference Series
Band 712
Heft 1
Seiten 011001
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