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The 16th International Conference on X-ray Absorption Fine Structure (XAFS16)

Grunwaldt, J.-D.; Hagelstein, M.; Rothe, J.

Abstract (englisch):
This preface of the proceedings volume of the 16th International Conference on X- ray Absorption Fine Structure (XAFS16) gives a glance on the five days of cutting-edge X-ray science which were held in Karlsruhe, Germany, August 23 - 28, 2015. In addition, several satellite meetings took place in Hamburg, Berlin and Stuttgart, a Sino-German workshop, three data analysis tutorials as well as special symposia on industrial catalysis and XFELs were held at the conference venue.

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Volltext §
DOI: 10.5445/IR/1000057904
Originalveröffentlichung
DOI: 10.1088/1742-6596/712/1/011001
Zugehörige Institution(en) am KIT Institut für Technische Chemie und Polymerchemie (ITCP)
Institut für Nukleare Entsorgung (INE)
Institut für Katalyseforschung und -Technologie (IKFT)
Institut für Beschleunigerphysik und Technologie (IBPT)
Publikationstyp Zeitschriftenaufsatz
Jahr 2016
Sprache Englisch
Identifikator ISSN: 1742-6588
urn:nbn:de:swb:90-579041
KITopen-ID: 1000057904
HGF-Programm 56.98.01 (POF III, LK 01)
Erschienen in Journal of physics / Conference Series
Band 712
Heft 1
Seiten 011001
Nachgewiesen in Scopus
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