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DOI: 10.5445/IR/1000082041
Veröffentlicht am 17.04.2018

Cross-Layer Dependability for Runtime Reconfigurable Architectures

Zhang, Hongyan

Abstract (englisch):
FPGA-based reconfigurable computing combines the efficiency of hardware with the flexibility of software and is becoming competitive against conventional processor architectures. However, at advanced technology nodes, FPGAs are facing various dependability threats. By exploiting the flexibility that is inherent in reconfigurable architectures, this work presents a comprehensive solution for fault discovery, fault tolerance and aging mitigation, defending against both permanent and transient faults.

Zugehörige Institution(en) am KIT Institut für Technische Informatik (ITEC)
Publikationstyp Hochschulschrift
Jahr 2018
Sprache Englisch
Identifikator URN: urn:nbn:de:swb:90-820417
KITopen ID: 1000082041
Verlag Karlsruhe
Umfang XXII, 149 S.
Abschlussart Dissertation
Fakultät Fakultät für Informatik (INFORMATIK)
Institut Institut für Technische Informatik (ITEC)
Prüfungsdatum 11.05.2017
Referent/Betreuer Prof. J. Henkel
Schlagworte Runtime reconfiguration, Aging mitigation, Fault-tolerance, Resilience, Graceful degradation, FPGA, Soft error
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