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Verlagsausgabe
DOI: 10.5445/IR/1000089346
Veröffentlicht am 10.01.2019
Originalveröffentlichung
DOI: 10.1088/1748-0221/13/12/P12009

Test beam measurement of ams H35 HV-CMOS capacitively coupled pixel sensor prototypes with high-resistivity substrate

Benoit, M.; Braccini, S.; Casanova, R.; Cavallaro, E.; Chen, H.; Chen, K.; Bello, F.A. Di; Ferrere, D.; Frizzell, D.; Golling, T.; Gonzalez-Sevilla, S.; Grinstein, S.; Iacobucci, G.; Kiehn, M.; Lanni, F.; Liu, H.; Metcalfe, J.; Meng, L.; Merlassino, C.; Miucci, A.; ... mehr

Abstract:
In the context of the studies of the ATLAS High Luminosity LHC programme, radiation tolerant pixel detectors in CMOS technologies are investigated. To evaluate the effects of substrate resistivity on CMOS sensor performance, the H35DEMO demonstrator, containing different diode and amplifier designs, was produced in ams H35 HV-CMOS technology using four different substrate resistivities spanning from 80-1000 ohm cm$^{-1}$. A glueing process using a high-precision flip-chip machine was developed in order to capacitively couple the sensors to FE-I4 Readout ASIC using a thin layer of epoxy glue with good uniformity over a large surface. The resulting assemblies were measured in beam test at the Fermilab Test Beam Facilities with 120 GeV protons and CERN SPS H8 beamline using 180 GeV pions. The in-time efficiency and tracking properties measured for the different sensor types are shown to be compatible with the ATLAS ITk requirements for its pixel sensors.


Zugehörige Institution(en) am KIT Institut für Neutronenphysik und Reaktortechnik (INR)
Institut für Prozessdatenverarbeitung und Elektronik (IPE)
Publikationstyp Zeitschriftenaufsatz
Jahr 2018
Sprache Englisch
Identifikator ISSN: 1748-0221
URN: urn:nbn:de:swb:90-893465
KITopen-ID: 1000089346
Erschienen in Journal of Instrumentation
Band 13
Heft 12
Seiten P12009
Vorab online veröffentlicht am 04.12.2018
Schlagworte Analogue electronic circuits; Electronic detector readout concepts (solid-state); Front-end electronics for detector readout; VLSI circuits
Nachgewiesen in Web of Science
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