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Transient voltage stresses in MMC–HVDC links – impulse analysis and novel proposals for synthetic laboratory generation

Freye, Claudius; Wenig, Simon 1; Goertz, Max 1; Leibfried, Thomas 1; Jenau, Frank
1 Institut für Elektroenergiesysteme und Hochspannungstechnik (IEH), Karlsruher Institut für Technologie (KIT)

Abstract:

To evaluate and optimise insulation coordination concepts for state of the art high-voltage direct current (HVDC) transmission systems, appropriate test voltage shapes are required for laboratory imitation of occurring stresses. While especially transient voltages in the monopolar modular multilevel converter (MMC)–HVDC links show an extensive deviation from commonly applied switching impulse shapes, this study focusses on the analysis of over-voltages subsequent to direct current pole to ground faults. Additionally, novel methods for synthetic laboratory test voltage generation are proposed. Based on simulated transients occurring during fault scenarios in different symmetrical monopolar ±320 kV MMC–HVDC schemes, curve fitting, and related analysis techniques are used in order to compare simulated over-voltages with standard test voltage shapes. Moreover, these techniques further allow the identification of novel relevant impulse characteristics. Subsequently, design considerations for the generation of non-standard impulses based on single-stage circuits are derived and discussed. Those synthetically generated voltages may, later on, provide the basis for future investigations on related dielectric effects caused by those non-normative over-voltages.


Verlagsausgabe §
DOI: 10.5445/IR/1000090721
Veröffentlicht am 08.02.2019
Originalveröffentlichung
DOI: 10.1049/hve.2017.0141
Web of Science
Zitationen: 9
Dimensions
Zitationen: 12
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Elektroenergiesysteme und Hochspannungstechnik (IEH)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 06.2018
Sprache Englisch
Identifikator ISSN: 2397-7264
urn:nbn:de:swb:90-907210
KITopen-ID: 1000090721
HGF-Programm 37.06.01 (POF III, LK 01) Networks and Storage Integration
Erschienen in High voltage
Verlag Institution of Engineering and Technology (IET)
Band 3
Heft 2
Seiten 115–125
Nachgewiesen in Web of Science
Dimensions
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