Air pollution due to particulate matter, especially ultrafine particles, and the related negative effects (health problems, economic damage) has become one of the major problems our society is faced with today. In order to be able to investigate and to assess the real exposition of the general public in a comprehensive way, the performance of precise and accurate measurements of particulate matter is an essential part of air pollution control.
For the monitoring of ultrafine and engineered nanoparticles, typically Condensation Particle Counters and Differential Electric Mobility Sprectrometers are used. Depending on the aim of research the requirements on the monitoring instruments might be significantly different. Whereas for a general approach a low time resolution and higher detection limit might be acceptable, a more detailed analysis and source appointment desire detection limits down to 1nm, 1s time resolution or differentiation between volatile and non-volatile components. This presentation will show and discuss the possibilities and limitations of currently available instruments based on the examples from airport measurements or ship emissions.