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Void-And-Cluster Sampling of Large Scattered Data and Trajectories

Rapp, Tobias; Peters, Christoph; Dachsbacher, Carsten

We propose a data reduction technique for scattered data based on statistical sampling. Our void-and-cluster sampling technique finds a representative subset that is optimally distributed in the spatial domain with respect to the blue noise property. In addition, it can adapt to a given density function, which we use to sample regions of high complexity in the multivariate value domain more densely. Moreover, our sampling technique implicitly defines an ordering on the samples that enables progressive data loading and a continuous level-of-detail representation. We extend our technique to sample time-dependent trajectories, for example pathlines in a time interval, using an efficient and iterative approach. Furthermore, we introduce a local and continuous error measure to quantify how well a set of samples represents the original dataset. We apply this error measure during sampling to guide the number of samples that are taken. Finally, we use this error measure and other quantities to evaluate the quality, performance, and scalability of our algorithm.

Zugehörige Institution(en) am KIT Institut für Visualisierung und Datenanalyse (IVD)
Publikationstyp Forschungsbericht/Preprint
Publikationsjahr 2020
Sprache Englisch
Identifikator ISSN: 1077-2626, 1941-0506, 2160-9306
KITopen-ID: 1000104830
Verlag IEEE
Umfang 10 S.
Schlagwörter Data reduction, sampling, blue noise, entropy-based sampling, scattered data, pathlines
Nachgewiesen in arXiv
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