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Versatile application of a modern scanning electron microscope for materials characterization

Sun, Cheng; Lux, Stefan; Müller, Erich; Meffert, Matthias; Gerthsen, Dagmar

Scanning electron microscopy (SEM) is an indispensable characterization technique for materials science. More recently, scanning electron microscopes can be equipped with scanning transmission electron microscopy (STEM) detectors, which considerably extend their capabilities. It is demonstrated in this work that the correlative application of SEM and STEM imaging techniques provides comprehensive sample information on nanomaterials. This is highlighted by the use of a modern scanning electron microscope, which is equipped with in-lens and in-column detectors, a double-tilt holder for electron transparent specimens and a CCD camera for the acquisition of on-axis diffraction patterns. Using multi-walled carbon nanotubes and Pt/Al$_{2}$O$_{3}$ powder samples we will show that a complete characterization can be achieved by combining STEM (mass-thickness and diffraction) contrast and SEM (topography and materials) contrast. This is not possible in a standard transmission electron microscope where topography information cannot be routinely obtained. We also exploit the large tilt angle range of the specimen holder to perform 180 degrees STEM tomography on multi-walled carbon nanotubes, which avoids the missing wedge artifacts.

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Verlagsausgabe §
DOI: 10.5445/IR/1000122678
Veröffentlicht am 14.08.2020
DOI: 10.1007/s10853-020-04970-3
Zitationen: 1
Web of Science
Zitationen: 1
Zitationen: 1
Cover der Publikation
Zugehörige Institution(en) am KIT Laboratorium für Elektronenmikroskopie (LEM)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 10.2020
Sprache Englisch
Identifikator ISSN: 0022-2461, 1573-4803
KITopen-ID: 1000122678
Erschienen in Journal of materials science
Verlag Springer
Band 55
Heft 28
Seiten 13824–13835
Vorab online veröffentlicht am 06.07.2020
Nachgewiesen in Dimensions
Web of Science
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