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iRegNet: Non-rigid Registration of MRI to Interventional US for Brain-Shift Compensation using Convolutional Neural Networks

Zeineldin, R. A. 1; Karar, M. E.; Elshaer, Z.; Schmidhammer, M.; Coburger, J.; Wirtz, C. R.; Burgert, O.; Mathis-Ullrich, F. 1
1 Institut für Anthropomatik und Robotik (IAR), Karlsruher Institut für Technologie (KIT)


Accurate and safe neurosurgical intervention can be affected by intra-operative tissue deformation, known as brain-shift. In this study, we propose an automatic, fast, and accurate deformable method, called iRegNet, for registering pre-operative magnetic resonance images to intra-operative ultrasound volumes to compensate for brain-shift. iRegNet is a robust end-to-end deep learning approach for the non-linear registration of MRI-iUS images in the context of image-guided neurosurgery. Pre-operative MRI (as moving image) and iUS (as fixed image) are first appended to our convolutional neural network, after which a non-rigid transformation field is estimated. The MRI image is then transformed using the output displacement field to the iUS coordinate system. Extensive experiments have been conducted on two multi-location databases, which are the BITE and the RESECT. Quantitatively, iRegNet reduced the mean landmark errors from pre-registration value of (4.18 ± 1.84 and 5.35 ± 4.19 mm) to the lowest value of (1.47 ± 0.61 and 0.84 ± 0.16 mm) for the BITE and RESECT datasets, respectively. Additional qualitative validation of this study was conducted by two expert neurosurgeons through overlaying MRI-iUS pairs before and after the deformable registration. ... mehr

Verlagsausgabe §
DOI: 10.5445/IR/1000139772
Veröffentlicht am 12.11.2021
DOI: 10.1109/ACCESS.2021.3120306
Zitationen: 5
Web of Science
Zitationen: 4
Zitationen: 5
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Anthropomatik und Robotik (IAR)
Publikationstyp Zeitschriftenaufsatz
Publikationsdatum 14.10.2021
Sprache Englisch
Identifikator ISSN: 2169-3536
KITopen-ID: 1000139772
Erschienen in IEEE Access
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Band 9
Seiten 147579-147590
Nachgewiesen in Web of Science
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