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Interpretation of irregular water profiles at silica surfaces

Bucharsky, Claudia 1; Schell, Günter ORCID iD icon 1; Fett, Theo 1
1 Institut für Angewandte Materialien – Keramische Werkstoffe und Technologien (IAM-KWT1), Karlsruher Institut für Technologie (KIT)

Abstract:

In the present Report, we will discuss the irregular water distributions at silica surfaces as were reported by the measured data from Zouine et al. [1], especially those at room temperature. The question was whether the deviations from the usually found erfc-shaped water pro- files can be understood by competing diffusion and surface dissolution and whether back-diffusion after water or air storage, may affect the type of water profile. We will come to the conclusion that the irregular distributions of the measured data by Zouine et al. [1], especially those at room tem- perature, can be understood by back-diffusion after water or air storage, respectively.


Volltext §
DOI: 10.5445/IR/1000157958
Veröffentlicht am 19.04.2023
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Angewandte Materialien – Keramische Werkstoffe und Technologien (IAM-KWT1)
Publikationstyp Forschungsbericht/Preprint
Publikationsmonat/-jahr 04.2023
Sprache Englisch
Identifikator ISSN: 2194-1629
KITopen-ID: 1000157958
Verlag Karlsruher Institut für Technologie (KIT)
Umfang VI, 13 S.
Serie KIT Scientific Working Papers ; 214
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