Extracting, Mapping, Editing SEM Metadata
Aversa, Rossella
1; Joseph, Reetu
1; Vitali, Elias 1; Kirar, Ajay 1
1 Scientific Computing Center (SCC), Karlsruher Institut für Technologie (KIT)
1; Joseph, Reetu
1; Vitali, Elias 1; Kirar, Ajay 11 Scientific Computing Center (SCC), Karlsruher Institut für Technologie (KIT)
Abstract:
The presentation shows an overview of the Metadata Extraction and Mapping tool currently under deployment in SCC-DEM, the motivation behind its need, and the benefits of its use. The exemplary use case for Scanning Electron Microscopy images is presented.
| Zugehörige Institution(en) am KIT | Scientific Computing Center (SCC) |
| Publikationstyp | Vortrag |
| Publikationsdatum | 26.04.2023 |
| Sprache | Englisch |
| Identifikator | KITopen-ID: 1000158866 |
| HGF-Programm | 46.21.01 (POF IV, LK 01) Domain-Specific Simulation & SDLs and Research Groups |
| Veranstaltung | 1st Generelle KIT-Informationsveranstaltung MaTeLiS Pilot-Projekt Gerätepool (2023), Online, 26.04.2023 |
| Projektinformation | NEP (EU, H2020, 101007417) NFDI-MatWerk (DFG, NFDI 38/1) |
| Bemerkung zur Veröffentlichung | This work has been supported by NFDI-MatWerk (DFG – n. 460247524), NFFA-Europe-Pilot (EU H2020 – n. 101007417), and the research program ‘Engineering Digital Futures’ by the Helmholtz Research Association. |
| Schlagwörter | Metadata Extraction and Mapping Tool, Scanning Electron Microscopy |
