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Time Domain Modeling of Zero Voltage Switching behavior considering Parasitic Capacitances for a Dual Active Bridge

Sommer, Fabian ORCID iD icon 1; Menger, Nikolas ORCID iD icon 1; Merz, Tobias ORCID iD icon 1; Soltau, Nils; Idaka, Shiori; Hiller, Marc 1
1 Elektrotechnisches Institut (ETI), Karlsruher Institut für Technologie (KIT)

Abstract:

To increase the switching frequency in DC/DC converters, soft switching is necessary to limit switching losses. In case of the Dual Active Bridge (DAB), Zero Voltage Switching (ZVS) is used to reduce switching losses. Since the ZVS behavior of the DAB depends on multiple parameters, an accurate model is necessary to ensure operation with minimal losses by applying ZVS. This paper presents an accurate capacitance based time domain (CTD) model for the resonant commutation which enables the calculation of the minimal necessary current, the optimal deadtime as well as the voltage error caused by the nonideal commutation. The parasitics and therefore nonideal behavior of the MOSFETs are considered to further increase accuracy. The model can be used for all operating points commonly applied in single (SPS) and triple phase shift (TPS) modulation. Measurement results obtained with a 500 kW DAB prototype proves the high accuracy of the model.


Postprint §
DOI: 10.5445/IR/1000162139/post
Frei zugänglich ab 23.05.2024
Originalveröffentlichung
DOI: 10.23919/ICPE2023-ECCEAsia54778.2023.10213865
Scopus
Zitationen: 2
Dimensions
Zitationen: 1
Zugehörige Institution(en) am KIT Elektrotechnisches Institut (ETI)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 22.05.2023
Sprache Englisch
Identifikator ISBN: 979-8-3503-3620-7
KITopen-ID: 1000162139
Erschienen in 2023 11th International Conference on Power Electronics - ECCE Asia (ICPE 2023 - ECCE Asia), Jeju Island, Korea, Republic of, 22-25 May 2023
Veranstaltung 11th International Conference on Power Electronics - ECCE Asia (ICPE 2023), Jeju Island, Korea, 22.05.2023 – 25.05.2023
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 13–20
Nachgewiesen in Dimensions
Scopus
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