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Surface Saturation Current Densities of Perovskite Thin Films from Suns-Photoluminescence Quantum Yield Measurements

Chin, Robert Lee; Soufiani, Arman Mahboubi; Fassl, Paul ORCID iD icon 1; Zheng, Jianghui; Choi, Eunyoung; Ho-Baillie, Anita; Paetzold, Ulrich ORCID iD icon 1; Trupke, Thorsten; Hameiri, Ziv
1 Institut für Mikrostrukturtechnik (IMT), Karlsruher Institut für Technologie (KIT)

Abstract:

We present a simple, yet powerful analysis of Suns-photoluminescence quantum yield measurements that can be used to determine the surface saturation current densities of thin film semiconductors. We apply the method to state-of-the-art polycrystalline perovskite thin films of varying absorber thickness. We show that the non-radiative bimolecular recombination in these samples originates from the surfaces. To the best of our knowledge, this is the first study to demonstrate and quantify non-linear (bimolecular) surface recombination in perovskite thin films.


Volltext §
DOI: 10.5445/IR/1000167166
Veröffentlicht am 10.01.2024
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Mikrostrukturtechnik (IMT)
Publikationstyp Forschungsbericht/Preprint
Publikationsjahr 2023
Sprache Englisch
Identifikator KITopen-ID: 1000167166
HGF-Programm 38.01.05 (POF IV, LK 01) Simulations, Theory, Optics and Analytics (STOA)
Verlag arxiv
Umfang 14 S.
Schlagwörter Optics (physics.optics), Applied Physics (physics.app-ph)
Nachgewiesen in Dimensions
arXiv
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