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Surface saturation current densities of perovskite thin films from Suns‐photoluminescence quantum yield measurements

Chin, Robert Lee ; Soufiani, Arman Mahboubi; Fassl, Paul ORCID iD icon 1; Zheng, Jianghui; Choi, Eunyoung; Ho-Baillie, Anita; Paetzold, Ulrich W. ORCID iD icon 1; Trupke, Thorsten; Hameiri, Ziv
1 Institut für Mikrostrukturtechnik (IMT), Karlsruher Institut für Technologie (KIT)

Abstract:

We present a simple yet powerful analysis of Suns-photoluminescence quantum yield measurements that can be used to determine the surface saturation current densities of thin film semiconductors. We apply the method to state-of-the-art polycrystalline perovskite thin films of varying absorber thickness. We show that the non-radiative bimolecular recombination in these samples originates from the surfaces. To the best of our knowledge, this is the first study to demonstrate and quantify non-linear (bimolecular) surface recombination in perovskite thin films.


Verlagsausgabe §
DOI: 10.5445/IR/1000177056
Veröffentlicht am 09.12.2024
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Mikrostrukturtechnik (IMT)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2024
Sprache Englisch
Identifikator ISSN: 1062-7995, 1099-159X
KITopen-ID: 1000177056
HGF-Programm 38.01.04 (POF IV, LK 01) Modules, Stability, Performance and Specific Applications
Erschienen in Progress in Photovoltaics: Research and Applications
Verlag John Wiley and Sons
Vorab online veröffentlicht am 15.01.2024
Nachgewiesen in Scopus
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