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One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection

Ahmed, Soyed Tuhin ORCID iD icon 1; Tahoori, Mehdi B. 1
1 Institut für Technische Informatik (ITEC), Karlsruher Institut für Technologie (KIT)

Abstract:

Neural networks (NNs) are capable of learning complex patterns and relationships in data to make predictions with high accuracy, making them useful for various tasks. However, NNs are both computation-intensive and memory-intensive methods, making them challenging for edge applications. To accelerate the most common operations (matrix-vector multiplication) in NNs, hardware accelerator architectures such as computation-in-memory (CiM) with non-volatile memristive crossbars are utilized. Although they offer benefits such as power efficiency, parallelism, and nonvolatility, they suffer from various faults and variations, both during manufacturing and lifetime operations. This can lead to faulty computations and, in turn, degradation of post-mapping inference accuracy, which is unacceptable for many applications, including safety-critical applications. Therefore, proper testing of NN hardware accelerators is required. In this paper, we propose a \emph{one-shot} testing approach that can test NNs accelerated on memristive crossbars with only one test vector, making it very suitable for online testing applications. Our approach can consistently achieve 100% fault coverage across several large topologies with up to 201 layers and challenging tasks like semantic segmentation. ... mehr


Volltext §
DOI: 10.5445/IR/1000176420
Veröffentlicht am 19.11.2024
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Technische Informatik (ITEC)
Publikationstyp Forschungsbericht/Preprint
Publikationsmonat/-jahr 10.2024
Sprache Englisch
Identifikator KITopen-ID: 1000176420
Umfang 10 S.
Vorab online veröffentlicht am 08.04.2024
Schlagwörter one-shot testing, single-shot testing, functional testing, Memristor
Nachgewiesen in Dimensions
arXiv
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