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Family-Based Vulnerability Discovery for Software Product Lines

Bächle, Tim 1
1 Institut für Informationssicherheit und Verlässlichkeit (KASTEL), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

The exploitation of software vulnerabilities by attackers can have disastrous consequences.
Discoveries like Heartbleed strikingly demonstrated that despite this grave danger, serious vulnerabilities frequently go unnoticed. This problem is exacerbated through the introduction of Software Product Lines (SPLs), highly configurable software systems that give rise to a vast array of potentially vulnerable software products. Applying conventional static source code analysis solutions, which are a
common aid for the discovery of vulnerabilities, to these systems faces scalability and completeness issues. To address these issues, researchers introduced the concept of family-based analyses, which aim to analyze an SPL in its entirety rather than
individual products. While family-based analyses have been proposed for various objectives, previous work dedicated to family-based vulnerability discovery has been limited. Notably, there is no solution that leverages the benefits of Query-Based Static Application Security Testing (Q-SAST), which allows vulnerability patterns to be codified into queries controlling the analysis. Corresponding tools provide many benefits and enable convenient detection of even sophisticated vulnerabilities. ... mehr


Volltext §
DOI: 10.5445/IR/1000177489
Veröffentlicht am 18.12.2024
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Informationssicherheit und Verlässlichkeit (KASTEL)
Publikationstyp Hochschulschrift
Publikationsdatum 28.11.2024
Sprache Englisch
Identifikator KITopen-ID: 1000177489
HGF-Programm 46.23.03 (POF IV, LK 01) Engineering Security for Mobility Systems
Verlag Karlsruher Institut für Technologie (KIT)
Umfang xii, 107 S.
Art der Arbeit Abschlussarbeit - Master
Prüfungsdaten 28.11.2024 10.12.2024
Schlagwörter Software Product Lines, Vulnerability Detection, Static Analysis
Referent/Betreuer Schaefer, Ina
König, Christoph
Pett, Tobias
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