Application-Oriented Test Setup for Measuring Dynamic Output and Transfer Characteristics of GaN-HEMTs
Swoboda, Philipp
1; Fein, Martin 1; Frank, Simon
1; Liske, Andreas
1; Hiller, Marc 1
1 Elektrotechnisches Institut (ETI), Karlsruher Institut für Technologie (KIT)
1; Fein, Martin 1; Frank, Simon
1; Liske, Andreas
1; Hiller, Marc 11 Elektrotechnisches Institut (ETI), Karlsruher Institut für Technologie (KIT)
Abstract (englisch):
Apart from the excellent switching and conduction
properties of power GaN-HEMTs, trapping effects are still an
issue degrading the device’s performance. As conventional
methods have been proven inadequate for device characterization with
respect to trapping, new application-oriented characterization
methods have been developed in recent years. In this paper,
an application-oriented test setup for measuring output and
transfer characteristics is presented, which extends an existing
setup for the measurement of the dynamic on-resistance. Initial
results indicate that there is a significant change in characteristics
dependent on the applied off-state drain voltage bias. Addition-
ally, several typical trapping phenomena such as the dynamic
on-resistance, threshold voltage shift and current collapse were
observed.
properties of power GaN-HEMTs, trapping effects are still an
issue degrading the device’s performance. As conventional
methods have been proven inadequate for device characterization with
respect to trapping, new application-oriented characterization
methods have been developed in recent years. In this paper,
an application-oriented test setup for measuring output and
transfer characteristics is presented, which extends an existing
setup for the measurement of the dynamic on-resistance. Initial
results indicate that there is a significant change in characteristics
dependent on the applied off-state drain voltage bias. Addition-
ally, several typical trapping phenomena such as the dynamic
on-resistance, threshold voltage shift and current collapse were
observed.
| Zugehörige Institution(en) am KIT | Elektrotechnisches Institut (ETI) |
| Publikationstyp | Proceedingsbeitrag |
| Publikationsdatum | 16.03.2025 |
| Sprache | Englisch |
| Identifikator | ISBN: 979-83-315-1611-6 KITopen-ID: 1000181727 |
| Erschienen in | 2025 IEEE Applied Power Electronics Conference and Exposition (APEC), 16th - 20th March 2025, Atlanta |
| Veranstaltung | IEEE Applied Power Electronics Conference and Exposition (2025), Atlanta, GA, USA, 16.03.2025 – 20.03.2025 |
| Verlag | Institute of Electrical and Electronics Engineers (IEEE) |
| Seiten | 2348–2355 |
| Nachgewiesen in | Dimensions Scopus OpenAlex |