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Reliable Emerging Electronics in Wearable and Implantable Healthcare Applications

Pal, Priyanjana ORCID iD icon 1; Duarte, Paula Carolina Lozano ORCID iD icon 1; Kashyap, Suhas Krishna; Tahoori, Mehdi B. 1; Smith, Caroline J.; Jung, Yuna; Gulick, Daniel; Blain, Jennifer; Ozev, Sule
1 Institut für Technische Informatik (ITEC), Karlsruher Institut für Technologie (KIT)

Abstract:

Flexible electronics (FE) are enabling a new generation of wearable and implantable healthcare systems; however, ensuring reliable operation remains challenging due to process variability, mechanical deformation, and harsh physiological environments. In implantable settings, long-term exposure to bodily fluids and pressure variations accelerates device degradation, while strict constraints on power and integration make the use of batteries and active electronics undesirable. This work presents a cross-layer approach to reliability in flexible healthcare systems by combining passive implantable sensing with robust wearable electronics. At the circuit level, we introduce ReFlex-LDO, a gainboosted IGZO-TFT low-dropout regulator designed for capacitorlight operation and integrated with a structural delay-based built-in self-test (BIST) scheme, achieving ∼95% fault coverage with minimal overhead. For signal acquisition, we develop a hierarchical fault modeling and mitigation framework for IGZObased Flash ADCs, enabling up to 98% single-fault and 91% multi-fault coverage through targeted design enhancements. At the system level, we propose a passive RF-based sensing mechanism for monitoring fluid flow in implantable biomedical devices, eliminating the need for on-board power and improving long-term reliability. ... mehr


Originalveröffentlichung
DOI: 10.1109/VTS69484.2026.11563346
Zugehörige Institution(en) am KIT Institut für Technische Informatik (ITEC)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 27.04.2026
Sprache Englisch
Identifikator ISBN: 979-8-3315-6337-0
KITopen-ID: 1000194774
Erschienen in 2026 IEEE 44th VLSI Test Symposium (VTS)
Veranstaltung 44th IEEE VLSI Test Symposium (VTS 2026), Napa, CA, USA, 27.04.2026 – 29.04.2026
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 1–11
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