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Optimized and Aligned Anisotropic Monte Carlo Sampling Patterns

Werner, Mirco 1; Hanika, Johannes 1; Dachsbacher, Carsten 1
1 Institut für Visualisierung und Datenanalyse (IVD), Karlsruher Institut für Technologie (KIT)

Abstract:

Path tracing uses Monte Carlo integration to solve the rendering equation by evaluating the integrand at random sampling points. The convergence rate of the error can be significantly improved by using correlated instead of random sampling, especially on smooth integrands. However, on integrands with discontinuities due to, e.g., occlusion, the improvement is less pronounced. Prior work has shown that the variance of the estimator is equal to the product of the power spectrum of the integrand and the expected power spectrum of the sampling pattern. Discontinuous integrands have anisotropic power spectra that exhibit high energies along the directions of the discontinuities, which need to match the low-energy directions of the sampling pattern to reduce variance. However, existing anisotropic sampling patterns have at most two low-energy directions. Therefore, we propose an optimization-based algorithm to synthesize two-dimensional correlated sampling patterns with spectra that have more than two low-energy directions, leading to improved convergence behavior. Further, we propose a practical and sample-efficient algorithm that estimates the directions of discontinuities in the power spectra of two-dimensional integrands. ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000196197
Veröffentlicht am 14.08.2026
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Visualisierung und Datenanalyse (IVD)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2026
Sprache Englisch
Identifikator ISSN: 0167-7055, 1467-8659
KITopen-ID: 1000196197
Erschienen in Computer Graphics Forum
Verlag John Wiley and Sons
Seiten Art.-Nr.: e70534
Vorab online veröffentlicht am 05.08.2026
Nachgewiesen in Scopus
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