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A Current Distribution Mechanism Study Between an SiC MOSFET Body Diode and a Paralleled SiC Schottky Barrier Diode During Freewheeling

Zhang, Hongpeng ORCID iD icon 1; Steiner, Felix ORCID iD icon 1; Blank, Thomas ORCID iD icon 1
1 Institut für Prozessdatenverarbeitung und Elektronik (IPE), Karlsruher Institut für Technologie (KIT)

Abstract:

Paralleling an external SiC Schottky barrier diode (SBD) with an SiC MOSFET redistributes the reverse-conduction current and may reduce the reverse-recovery energy. However, the benefit depends on device selection and operating conditions, and an unsuitable SBD can increase the reverse-recovery energy. This paper presents simplified interval-specific models for turn-on, forward conduction, and turn-off and evaluates their qualitative trends using double-pulse tests. For the tested devices and operating conditions, the observed turn-on current distribution is qualitatively consistent with the combined influence of capacitive displacement currents and branch parasitic impedance. The forward-conduction waveforms exhibit case-temperature-dependent RL-type current redistribution. Compared with the configuration without an external SBD, the best-performing SBD group reduces the mean reverse-recovery energy Err by 19.8–54.5% at Tc = 25 ◦C and by 70.0–81.4% at Tc = 175 ◦C across four voltage–current operating points. Other SBD selections increase Err at low case temperature. Reducing the dead time from 3 μs to 500 ns increases the peak magnitude of the total reverse current by 36.8%. ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000197324
Veröffentlicht am 28.09.2026
Originalveröffentlichung
DOI: 10.3390/en19194491
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Prozessdatenverarbeitung und Elektronik (IPE)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2026
Sprache Englisch
Identifikator ISSN: 1996-1073
KITopen-ID: 1000197324
Erschienen in Energies
Verlag MDPI
Band 19
Heft 19
Seiten Article no: 4491
Vorab online veröffentlicht am 22.09.2026
Schlagwörter freewheeling diode; SiC MOSFET; Schottky diode; case temperature; reverse, recovery; parasitic inductance
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