Detection and Characterization of Inclusions in Impedance Tomography
Abstract:
The topic of this thesis are two further developments of the Factorization method for electrical impedance tomography.
We present a modification of this method that is capable of detecting mixed inclusions, i.e. both inclusions with a higher as well as inclusions with a lower conductivity than the background medium. In addition, we derive a new method to compute the conductivity inside inclusions after they have been localized.
We present a modification of this method that is capable of detecting mixed inclusions, i.e. both inclusions with a higher as well as inclusions with a lower conductivity than the background medium. In addition, we derive a new method to compute the conductivity inside inclusions after they have been localized.
| Zugehörige Institution(en) am KIT | Institut für Algebra und Geometrie (IAG) |
| Publikationstyp | Hochschulschrift |
| Publikationsjahr | 2010 |
| Sprache | Englisch |
| Identifikator | urn:nbn:de:swb:90-216293 KITopen-ID: 1000021629 |
| Verlag | Karlsruher Institut für Technologie (KIT) |
| Art der Arbeit | Dissertation |
| Fakultät | Fakultät für Mathematik (MATH) |
| Institut | Institut für Algebra und Geometrie (IAG) |
| Prüfungsdaten | 22.12.2010 |
| Schlagwörter | Inverse Problems, Factorization method, electrical impedance tomography |
| Relationen in KITopen | |
| Referent/Betreuer | Kirsch, A. |