Detection and characterization of inclusions in impedance tomography
Abstract:
The topic of this work are two further developments of the Factorization method for electrical impedance tomography.
We present a modification of this method that is capable of detecting mixed inclusions, i.e. both inclusions with a higher as well as inclusions with a lower conductivity than the background medium. In addition, we derive a new method to compute the conductivity inside inclusions after they have been localized.
We present a modification of this method that is capable of detecting mixed inclusions, i.e. both inclusions with a higher as well as inclusions with a lower conductivity than the background medium. In addition, we derive a new method to compute the conductivity inside inclusions after they have been localized.
| Zugehörige Institution(en) am KIT | Institut für Algebra und Geometrie (IAG) |
| Publikationstyp | Hochschulschrift |
| Publikationsjahr | 2011 |
| Sprache | Englisch |
| Identifikator | ISBN: 978-3-86644-635-9 urn:nbn:de:0072-218386 KITopen-ID: 1000021838 |
| Verlag | KIT Scientific Publishing |
| Umfang | VIII, 135 S. |
| Art der Arbeit | Dissertation |
| Fakultät | Fakultät für Mathematik (MATH) |
| Institut | Institut für Algebra und Geometrie (IAG) |
| Prüfungsdaten | 22.12.2011 |
| Schlagwörter | Inverse Problem, Electrical Impedance Tomography, Factorization Method |
| Relationen in KITopen | |
| Referent/Betreuer | Kirsch, A. |