Resolving locations of defects in superconducting transmon qubits
Abstract (englisch):
Despite tremendous progress of quantum computation with superconducting qubits, up-scaling for practical applications is hindered by decoherence and fluctuations induced by material defects. In this work, a qubit interface has been developed to study the microscopic nature of individual defects in a probe material. Further, a portable method has been developed to find locations of individual defects in ready-made qubit samples, which offers to test and improve micro-fabrication of qubits.
| Zugehörige Institution(en) am KIT | Physikalisches Institut (PHI) |
| Publikationstyp | Hochschulschrift |
| Publikationsjahr | 2019 |
| Sprache | Englisch |
| Identifikator | ISBN: 978-3-7315-0967-7 ISSN: 2191-9925 KITopen-ID: 1000097557 |
| Verlag | KIT Scientific Publishing |
| Umfang | II, 110 S. |
| Serie | Experimental Condensed Matter Physics / Karlsruher Institut für Technologie, Physikalisches Institut ; 27 |
| Art der Arbeit | Dissertation |
| Fakultät | Fakultät für Physik (PHYSIK) |
| Institut | Physikalisches Institut (PHI) |
| Prüfungsdatum | 08.02.2019 |
| Schlagwörter | Quanten Bits, Transmon Qubit, Quantenrechner, Materialdefekte und Dekohärenz, Defektspektroskopie mitt elektrischer und elastischer Felder, Quantum bit, transmon qubit, quantum computing, material defects and decoherence, spectroscopy of defects with dc-electric and elastic fields |
| Relationen in KITopen | |
| Referent/Betreuer | Ustinov, A. V. |