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OCM 2013 - Optical Characterization of Materials - conference proceedings

Beyerer, Jürgen; Puente León, Fernando; Längle, Thomas [Hrsg.]

Abstract:
The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.

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Volltext §
DOI: 10.5445/KSP/1000032143
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Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Anthropomatik (IFA)
Institut für Industrielle Informationstechnik (IIIT)
Institut für Prozessrechentechnik, Automation und Robotik (IPR)
Publikationstyp Proceedingsband
Publikationsjahr 2013
Sprache Deutsch
Identifikator ISBN: 978-3-86644-965-7
urn:nbn:de:0072-321434
KITopen-ID: 1000032143
Verlag KIT Scientific Publishing
Umfang X, 285 S.
Schlagwörter Spectroscopy, Spectral Data Processing, Material Characterization, Measurement Principals, Inspection Systems
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