VerifyThis – Verification Competition with a Human Factor Ernst, G.; Huisman, M.; Mostowski, W.; Ulbrich, M. 2019. 25th International Conference on Tools and Algorithms for the Construction and Analysis of Systems conference series, TACAS 2019 held as part of the 22nd European Joint Conferences on Theory and Practice of Software, ETAPS 2019; Prague; Czech Republic; 6 April 2019 through 11 April 2019. Ed.: B. Steffen, 176–195, Springer. doi:10.1007/978-3-030-17502-3_12
LPWAN Applications in the 2.4 GHz Band: A Viable Choice? Wunsch, F.; Stroer, M.; Muller, M.; Jakel, H.; Jondral, F. K. 2019. 88th IEEE Vehicular Technology Conference, VTC-Fall 2018; Chicago; United States; 27 August 2018 through 30 August 2018, Art. Nr.: 8690804, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/VTCFall.2018.8690804
Femtosecond pulse induced nanostructures in ULE™ glass Zimmermann, F.; Plech, A.; Richter, S.; Schmitt, A.; Tünnermann, A.; Nolte, S. 2019. 2015 European Conference on Lasers and Electro-Optics - European Quantum Electronics Conference, CLEO/Europe-EQEC 2015; International Congress Centre (ICM)Munich; Germany; 21 June 2015 through 25 June 2015, The Optical Society
Analysis of coupled exposures considering the rapid chloride migration test and the accelerated carbonation test Vogel, M.; Schmiedel, S.; Müller, H. S. 2019. 6th International Symposium on Life-Cycle Civil Engineering, IALCCE 2018; Ghent; Belgium; 28 October 2018 through 31 October 2018. Life-Cycle Analysis and Assessment in Civil Engineering: Towards an Integrated Vision - Proceedings of the 6th International Symposium on Life-Cycle Civil Engineering, IALCCE 2018, 1887–1894, CRC Press
A Service-Oriented Approach for the Cognitive Factory-A Position Paper Colangelo, E.; Hartleif, S.; Kroger, T.; Bauernhansl, T. 2019. 1st International Conference on Artificial Intelligence in Information and Communication, ICAIIC 2019; Pacific Hotel Okinawa3-6-1Nishi Naha City Okinawa Prefecture Okinawa; Japan; 11 February 2019 through 13 February 2019, 540–542, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICAIIC.2019.8668990