Combining Graph-Based and Deduction-Based Information-Flow Analysis Beckert, B.; Bischof, S.; Herda, M.; Kirsten, M.; Kleine Büning, M. 2017. ETAPS 2017: 5th Workshop on Hot Issues in Security Principles and Trust : Hotspot 2017, Uppsala, Sweden, 22-29 April 2017, 6–25, Theoretical Foundations of Security Analysis and Design (IFIP WG 1.7)
In-Antenna Power-Combining Methods Goettel, B.; Schäfer, J.; Bhutani, A.; Gulan, H.; Zwick, T. 2017. EuCAP 2017 : Proceedings of the 11th European Conference on Antennas and Propagation, Paris, France, 19-24 March 2017, 2776–2730, Institute of Electrical and Electronics Engineers (IEEE). doi:10.23919/EuCAP.2017.7928385
Molecular Graph Paper Lindner, M.; Valášek, M.; Mayor, M.; Frauhammer, T.; Wulfhekel, W.; Gerhard, L. 2017. Angewandte Chemie / International edition, 56 (28), 8290–8294. doi:10.1002/anie.201703586
WCET-aware parallelization of model-based applications for multi-cores : The ARGO approach Derrien, S.; Puaut, I.; Alefragis, P.; Bednara, M.; Bucher, H.; David, C.; Debray, Y.; Durak, U.; Fassi, I.; Ferdinand, C.; Hardy, D.; Kritikakou, A.; Rauwerda, G.; Reder, S.; Sicks, M.; Stripf, T.; Sunesen, K.; Ter Braak, T.; Voros, N.; Becker, J. 2017. Proceedings of the 20th Design, Automation and Test in Europe, Lausanne, Switzerland, 27-31 March 2017, 286–289, Institute of Electrical and Electronics Engineers (IEEE). doi:10.23919/DATE.2017.7927000
Scalable probabilistic power budgeting for many-cores Pathania, A.; Khdr, H.; Shafique, M.; Mitra, T.; Henkel, J. 2017. 20th Design, Automation and Test in Europe, SwissTech Convention CenterSwisstech, Lausanne, Switzerland, 27. - 31. March, 2017, 864–869, Institute of Electrical and Electronics Engineers (IEEE). doi:10.23919/DATE.2017.7927108
Fast deep vehicle detection in aerial images Sommer, L. W.; Schuchert, T.; Beyerer, J. 2017. 17th IEEE Winter Conference on Applications of Computer Vision, Santa Rosa, United States, 24. - 31. March, 2017, 311–319, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2017.41
Probabilistic surface inference for industrial inspection planning Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H. 2017. 17th IEEE Winter Conference on Applications of Computer Vision, Santa Rosa, United States, 24. - 31. March, 2017, 1008–1016, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2017.117
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