Integrated SMA-based NEMS actuator for optical switching Lambrecht, F.; Aseguinolaza, I.; Chernenko, V.; Kohl, M. 2016. MEMS 2016 : The 29th IEEE International Conference on Micro Electro Mechanical Systems, Shanghai, China, January 24-28, 2016. Ed.: H. Toshiyoshi, 79–82, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MEMSYS.2016.7421562
Breaking the Unwritten Language Barrier: The BULB Project Adda, G.; Stüker, S.; Adda-Decker, M.; Ambouroue, O.; Besacier, L.; Blachon, D.; Bonneau-Maynard, H.; Godard, P.; Hamlaoui, F.; Idiatov, D.; Kouarata, G.-N.; Lamel, L.; Makasso, E.-M.; Rialland, A.; Van De Velde, M.; Yvon, F.; Zerbian, S. 2016. 5th Workshop on Spoken Language Technologies for Under-resourced languages, SLTU 2016, The Phoenix Hotel Yogyakarta, Indonesia, 9. May 2016 through 12. May 2016, 8–14, Curran. doi:10.1016/j.procs.2016.04.023
3D ultrasound computer tomography: Update from a clinical study Hopp, T.; Zapf, M.; Kretzek, E.; Henrich, J.; Tukalo, A.; Gemmeke, H.; Kaiser, C. G. N.; Knaudt, J.; Ruiter, N. V. 2016. Medical Imaging 2016: Ultrasonic Imaging and Tomography, 27. February - 03. March 2016 San Diego, CA, United States, Art.Nr.: 97900A, SPIE. doi:10.1117/12.2216686
Standards - An Important Step for the (Public) Use of Lidars Althausen, D.; Emeis, S.; Flentje, H.; Guttenberger, J.; Jackel, S.; Lehmann, V.; Mattis, I.; Munkel, C.; Peters, G.; Ritter, C.; Wiegner, M.; Wille, H. 2016. 27th International Laser Radar Conference, ILRC 2015, Shepard Hall of the City College of New York (CCNY) New York, United States, 5 July 2015 through 10 July 2015, Art.Nr.: 23023, EPD Sciences. doi:10.1051/epjconf/201611923023
4H-SiC neutron sensors based on ion implanted 10B neutron converter layer Issa, F.; Ottaviani, L.; Szalkai, D.; Vermeeren, L.; Vervisch, V.; Lyoussi, A.; Ferone, R.; Kuznetsov, A. Y.; Lazăr, M.; Klix, A.; Palais, O.; Hallén, A. 2016. 4th International Conference on Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA); Lisbon; Portugal; 20 - 24 April 2015, 7465544/1–5, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ANIMMA.2015.7465544