Fully Automated Wide Temperature Range Semiconductor Characterization Frank, S. R.; Hansel, J.; Bitterle, J.; Schwendemann, R.; Hiller, M. 2023, September. 25th European Conference on Power Electronics and Applications (EPE`23 ECCE Europe 2023), Aalborg, Denmark, September 4–8, 2023
Discontinuation inception: a theoretical view Sardo, S.; Callegari, B. 2023. Italian Society for Social Studies of Science and Technology Italia Conference (STS 2023), Bologna, Italy, June 28–30, 2023